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Hi Rob.

Long time..hope all is well..

What we can remove because of masking or capability is very important..that is a followup step, but is not part of the starting model.

My approach is: if you wish to design a measuring method..first, what is the feature size you are talking about..then, is the current measurement technique capable of the resolution..

Imagine trying to measure IR hexfet chip cell sizes using an odometer.

Cheers, John


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  • Hi Rob. - jneutron 08:43:50 06/09/05 (0)


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