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Re: and again

Your method is pure anarchy. It is the electrical and thermal equivalent of tossing noise and hoping something comes out. And then, when something comes out, guessing and tweaking.

Using two controlled signals allows specific conditions to be duplicated, allowing for the capture of transient events. Any condition whatsoever can be duplicated, any thermal history, any location on the VI space, and any vector stimulus on the VI space.

It can measure the response to any condition possible which occurs as a result of any load.

All you state... "heating of the output stage due to those phase relationships...""or activation of the VI limiiter circuits"" ""or caused a bias circuit to drift, etc.""

...can be trivially induced into any amplifier via input drive signals and external drive forcing.

jr: ""
NONE of that would show up with the injected tones, the fleeting blip of that special relationship that exists with back-EMF would never be there long enough to be able to be measured readily.""

It is trivial to do such, and in fact, is commonly used even for "refrigerator magnets" here, where measurements during transient conditions are required. Duplication of the transients require huge numbers of passes, and attention to the initial conditions, but that's what engineering is about.

Throwing a huge complex test signal with a terribly difficult to analyze load, is of little diagnostic value other than for tweaking. It may be of some use to spot possible difference before and after, but for understanding of circuit issues, it doesn't provide any insight beyond the guesses one would already have.

Cheers, John



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